Powerful, non-destructive qualitive and quantitative elemental analysis

The Rigaku NEX DE Series is ideal for small-spot EDXRF measurements. These high-performance, direct excitation EDXRF spectrometers designed to deliver exceptional elemental analysis capabilities. Utilizing a high-powered X-ray tube, these instruments offer superior analytical performance with higher count rates, improved precision, and the ability to analyze even the most challenging materials with ease. This versatility enables the NEX DE Series to support a wide range of applications, from demanding quality control tasks to those precise small spot analyses. 

NEX DE Series elemental analyzers deliver high-performance results, making them ideal when fast analysis times or high sample throughput are essential. These instruments offer expanded analytical capabilities, such as higher sample batch throughput, small-spot analysis, and improved performance for measurement higher atomic number elements. They are designed for speed and precision, making them ideal for high-volume analytical labs and fast-paced environments. 

Empowering your analysis with high-performance EDXRF

The Rigaku NEX DE Series are high-performance, direct excitation energy dispersive X-ray fluorescence (EDXRF) spectrometers. They offer rapid, non-destructive elemental analysis of elements from sodium to uranium in almost any sample type.

They feature a 60 kV, 12 W X-ray tube, single and multilayer tube filters, and a high-throughput silicon drift detector (SDD) capable of handling count rates over 500K cps. The high count rates enable low detection limits and excellent spectral resolution. High-throughput measurements are achieved with various interchangeable automatic sample changers. Combined with the powerful QuantEZ software, these features deliver unmatched performance.

Small-spot EDXRF measurements

For small-spot analysis applications, the NEX DE VS model features a high-resolution camera and automated collimators for precise sample positioning at 1 mm, 3 mm, and 10 mm spot sizes. Its spacious sample chamber accommodates samples up to 30 cm in diameter and 10 cm in height. 

The Point Analysis interface and integrated backlit camera make sample positioning easy. The NEX DE VS is ideal for measuring coatings on smaller parts, screening small samples for electronic waste initiatives. It’s also excellent for identifying foreign matter of unknown composition. 

Key advantages and features of the NEX DE Series for small-sport EDXRF measurements:

• Non-destructive elemental analysis for sodium (Na) to uranium (U)
• Solids, liquids, alloys, powders and thin films
• High-performance SDD for superior data
• Unmatched performance-to-price ratio
• Powerful and easy-to-use QuantEZ software with multilingual user interface
• 60 kV X-ray tube for wide elemental coverage
• Multiple automated tube filters for enhanced sensitivity
• Advanced RPF-SQX Fundamental Parameters software featuring Rigaku Scattering FP
• SureDI support for 21 CFR Part 11 compliance
• High-res camera and automated collimators for accurate sample positioning (NEX DE VS)
• Analyze 1 mm, 3 mm, and 10 mm spot sizes (NEX DE VS)

Whether for basic quality control (QC) or more sophisticated variants like analytical quality control (AQC), quality assurance (QA), or statistical process control such as Six Sigma, NEX DE Series spectrometers deliver quick, high-performance results without the need for complex setups.

Models include NEX DE and NEX DE VS