Structure Analysis

Automated multipurpose X-ray diffractometer (XRD) with Guidance software. Powder diffraction, thin film metrology, SAXS, in-plane scattering, operando measurements.

Highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance.

Powder diffraction, thin film diffraction, SAXS, pole figure, residual stress and non-ambient experiments.

Benchtop powder X-ray diffraction (XRD) instrument. Qualitative and quantitative phase analysis of poly-crystalline materials.

High-speed, stationary sample microtomography of large samples

High-resolution benchtop microtomography of large samples

Ultra-high resolution nanotomography using parallel beam geometry.

True submicron high-contrast X-ray computed tomography

X-ray scattering instrument designed for nano-structure analyses. NANOPIX can be used for both small angle scattering (SAXS) and wide angle scattering (WAXS) measurements

Benchtop small angle X-ray scattering (SAXS) system, engineered to deliver automatic nanoparticle size distribution analysis.