The CIQTEK SEM4000X is a stable, versatile, flexible, and efficient field emission scanning electron microscope (FE-SEM). It achieves a resolution of [email protected], and easily tackles high-resolution imaging challenges for various types of samples. It can be upgraded with an ultra-beam deceleration mode to enhance low-voltage resolution even further.

The microscope utilizes multi-detector technology, with an in-column electron detector (UD) capable of detecting SE and BSE signals while providing high-resolution performance. Its chamber-mounted electron detector (LD) incorporates crystal scintillator and photomultiplier tubes, offering higher sensitivity and efficiency, resulting in stereoscopic images with excellent quality. The graphic user interface is user-friendly, featuring automation functions such as automatic brightness & contrast, auto-focus, auto stigmator, and automatic alignment, allowing for rapid capture of ultra-high resolution images.

Electron optics

Software options

• Particle & Pore Analysis Software (Particle) *Optional
  The CIQTEK SEM Microscope software employs various target detection and segmentation algorithms, suitable for different types of particle and pore samples. It enables quantitative analysis of particle and pore statistics and can be applied in fields such as materials science, geology, and environmental science.
  
• Image Post-processing Software *Optional
  Perform online or offline image post-processing on images captured by electron microscopes and integrate commonly used EM image processing functions, convenient measurement, and annotation tools.
  
• Auto Measure *Optional
  Automatic recognition of line width edges, resulting in more accurate measurements and higher consistency. Support multiple edge detection modes, such as Line, Space, Pitch, etc. Compatible with multiple image formats and equipped with various commonly used image post-processing functions. The software is easy to use, efficient, and accurate.
  
• Software Development Kit (SDK) *Optional
  Provides a set of interfaces for controlling the SEM microscope, including image acquisition, operating condition settings, power on/off, stage control, etc. Concise interface definitions allow for the rapid development of specific electron microscope operation scripts and software, enabling automated tracking of regions of interest, industrial automation data acquisition, image drift correction, and other functions. Can be used for software development in specialized areas such as diatom analysis, steel impurity inspection, cleanliness analysis, raw material control, etc.
  
• AutoMap *Optional