NEX CG II Series spectrometers solve elemental analysis challenges using a unique Cartesian Geometry optical kernel for the highest sensitivity. These instruments are ideal for ultra-low and trace-level performance, excelling at complex applications with trace elements and variable base matrices.

The Rigaku NEX CG II Series are powerful second-generation benchtop energy dispersive X-ray fluorescence (EDXRF) spectrometers. They perform rapid qualitative and quantitative elemental analyses and address needs across many industries. NEX CG II Series spectrometers serve a broad range of applications and are ideal for measuring ultra-low and trace element concentrations up to percent levels.
Unlike conventional EDXRF spectrometers, NEX CG II Series are indirect excitation systems using secondary targets rather than tube filters. Monochromatic and polarized excitation from secondary targets vastly improves detection limits for elements in highly scattering matrices like water, hydrocarbons, and biological materials. Secondary target excitation in full 90° Cartesian Geometry eliminates background noise. As a result, the NEX CG II Series spectrometers bring a new level of analytical sensitivity to XRF technology. Users can measure ultra-low and trace element concentrations, even in challenging sample types.

NEX CG II Series spectrometers are well suited for the following applications:

• Agricultural soil and plant materials
• Finished animal feeds
• Waste oils
• Environmental monitoring
• Pharmaceuticals and cosmetics
• Catalysts
• Monitoring for toxic metals in aerosols on air filters
• Trace heavy metals and rare earth elements (REE)
• Other applications that require a high degree of sensitivity

NEX CG II Series – Key Advantages and Features

• Non-destructive elemental analysis for sodium (Na) to uranium (U)
• Quick elemental analyses of solids, liquids, powders, coatings, and thin films
• Indirect excitation for exceptionally low detection limits
• High-power X-ray tubes (50 kV 50 W or 65 kV 100 W)
• Large-area high-throughput silicon drift detector (SDD)
• Analysis in air, helium, or vacuum
• Powerful and easy-to-use QuantEZ software with multilingual user interface
• Advanced RPF-SQX Fundamental Parameters software featuring Scattering FP
• Rigaku Profile Fitting (RPF) advanced algorithm for peak deconvolution
• SureDI support for 21 CFR Part 11 compliance
• Various automatic sample changers accommodating up to 52 mm samples
• Low cost of ownership