NEX DE Series elemental analyzers deliver high-performance results when analysis time or sample throughput is critical. These instruments provide expanded analytical capabilities, including higher sample batch throughput, small spot analysis, or enhanced performance for measurement of higher atomic number elements.

The Rigaku NEX DE Series are high-performance, direct excitation energy dispersive X-ray fluorescence (EDXRF) spectrometers. These instruments provide rapid, non-destructive elemental analysis of sodium to uranium in almost any sample type.
NEX DE Series spectrometers have a 60 kV, 12 W X-ray tube, single and multilayer tube filters, and a high-throughput silicon drift detector (SDD) that supports count rates over 500K cps. The high-count rates deliver low limits of detection and provide excellent spectral resolution. Combined with the powerful QuantEZ software, these features provide unparalleled performance.
For applications requiring small spot analysis, the NEX DE VS model offers a high-resolution camera and automated collimators to allow for precise positioning of samples to analyze 1 mm, 3 mm, and 10 mm spot sizes.
Whether the need is basic quality control (QC) or its more sophisticated variants such as analytical quality control (AQC), quality assurance (QA), or statistical process control like Six Sigma — NEX DE Series spectrometers deliver quick, high-performance results without complex setups.

Models include NEX DE and NEX DE VS.

Key advantages and features of the NEX DE Series:

• Non-destructive elemental analysis for sodium (Na) to uranium (U)
• Solids, liquids, alloys, powders and thin films
• High-performance SDD for superior data
• Unmatched performance-to-price ratio
• Powerful and easy-to-use QuantEZ software with multilingual user interface
• 60 kV X-ray tube for wide elemental coverage
• Multiple automated tube filters for enhanced sensitivity
• Advanced RPF-SQX Fundamental Parameters software featuring Rigaku Scattering FP
• SureDI support for 21 CFR Part 11 compliance
• High-res camera and automated collimators for accurate sample positioning (NEX DE VS)
• Analyze 1 mm, 3 mm, and 10 mm spot sizes (NEX DE VS)