Rigaku SmartLab® is the newest and most novel high-resolution X-ray diffractometer (XRD) available today. Perhaps its most novel feature is the new SmartLab Studio II software, which provides the user with an intelligent User Guidance expert system functionality that guides the operator through the intricacies of each experiment. It is like having an expert standing by your side.
This new X-ray diffraction system features the PhotonMax high-flux 9 kW rotating anode X-ray source coupled with a HyPix-3000 high-energy-resolution 2D multidimensional semiconductor detector that supports 0D, 1D and 2D measurement modes, allowing all applications to be handled with a single detector, eliminating the inconvenience of preparing and switching individual detectors for different applications. The HyPix-3000 detector can be used to obtain 2D powder diffraction patterns, which can be processed to deliver superior qualitative analysis by using all the 2D pattern information. The system incorporates a high-resolution θ/θ closed loop goniometer drive system with an available in-plane diffraction arm. The system’s new Cross-Beam-Optics (CBO) family feature fully automated switchable reflection and transmission optics (CBO-Auto).
Coupling a computer controlled alignment system with a fully automated optical system, and the User Guidance functionality within the SmartLab Studio II software, makes it easy to switch between hardware modes, ensuring that your hardware complexity is never holding back your research.
Whether you are working with thin films, nanomaterials, powders, or liquids the SmartLab will give you the XRD functionality to make the measurements you want to make when you want to make them. The equipment accepts powder, liquid, films, and even textile samples and allows mapping measurements within suitable samples. Operando (a.k.a., real time in-situ) measurements can be performed with the new Rigaku SmartLab Studio II software suite, which is an integrated software platform incorporating all functions from measurement to analysis. The system also features robust security and validation protocols to ensure that any technology component – software or hardware – fulfills its purpose within regulatory guidelines, including 21 CFR Part 11, establishing the US EDA regulations governing electronic records and electronic signatures (ER/ES).
|Technique||X-ray diffraction (XRD)|
|Benefit||Powder diffraction, thin film, SAXS, in-plane scattering, operando measurements|
|Technology||Automated high-resolution θ-θ multipurpose X-ray diffractometer (XRD) with expert system Guidance software|
|Core attributes||3 kW sealed X-ray tube, CBO optics, D/teX Ultra 250 silicon strip detector|
|Core options||PhotonMax high-flux 9 kW rotating anode X-ray source, in-plane arm (5-axis goniometer), HyPix-3000 high energy resolution 2D HPAD detector, Johansson Kα₁ optics|
|Computer||External PC, MS Windows® OS, SmartLab Studio II software|
|Core dimensions||1300 (W) x 1880 (H) x 1300 (D) mm|
|Mass (core unit)||Approx. 750 kg (sealed tube) , 850 kg (rotating anode)|
|Power requirements||3Ø, 200 V 50/60 Hz, 30 A (sealed tube) or 60 A (rotating anode)|