The CIQTEK SEM3300 scanning electron microscope (SEM) incorporates technologies such as “Super-Tunnel” electron optics, inlens electron detectors, and electrostatic & electromagnetic compound objective lens. By applying these technologies to the tungsten filament microscope, the long-standing resolution limit of such SEM is surpassed, enabling the tungsten filament SEM to perform low-voltage analysis tasks previously only achievable with field emission SEMs.

Features:

• Break Through the Resolution Limit of Tungsten Filament SEMs
• In-lens Electron Detector
• Electromagnetic & Electrostatic Combo Objective Lens
• Safer to Use
  • Infrared CCD
    Real-time chamber interior motion monitoring using image recognition and motion capture technology.
  • Anti-collision (Software)
    Manually input the sample height to accurately define the distance between the sample and the objective lens to prevent collisions.
  • Anti-collision (Hardware)
    Shut off the power to the stage motor at the moment of collision to minimize damage.
• Excellent Expandability

In-lens Electron Detector

Optical Navigation

Using a vertically mounted chamber camera to capture optical images for specimen stage navigation allows for a more intuitive and accurate specimen positioning.

Auto Functions

• Automatic Focus
• Automatic Astigmatism Correction
• Automatic Brightness & Contrast