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FESEM | SEM4000 Pro

Analytical Field Emission Scanning Electron Microscope (FESEM) with Large Beam

FESEM | SEM4000X

Stable, Versatile, Flexible, and Efficient field emission scanning electron microscope (FE-SEM)

FESEM | SEM5000 Pro

High Resolution under Low Excitation
x-ray fluorescence spectrometers

NEX CGII

High-performance indirect excitation EDXRF for complex applications with trace elements and variable base matrices

Tungsten Filament SEM | SEM2100

Easy-to-use Scanning Electron Microscope Even for Novices

Tungsten Filament SEM | SEM3200

High-performance and Universal Tungsten Filament SEM Microscope

Tungsten Filament SEM | SEM3300

Next-generation Tungsten Filament Scanning Electron Microscope

Ultra-high Res FESEM | SEM5000X

Ultra-high Resolution Field Emission Scanning Electron Microscopy (FESEM)
small-spot analysis

NEX DE Series

60 kV EDXRF for high-performance results when analysis time or sample throughput is critical or when small spot analysis is required.
QuantEZ software

NEX QC+ QuantEZ

Benchtop Energy Dispersive X-ray Fluorescence (EDXRF) elemental analyzer. Non-destructively analyze from sodium (Na) through uranium (U) in almost any matrix, from solids and alloys to powders, liquids and slurries.
Affordable Benchtop EDXRF Spectrometer

NEX QC Series

Combine performance and affordability for a wide range of analytical needs.

NEX LS

The Rigaku NEX LS represents the next evolution of scanning multi-element process coatings analyzers for web or coil applications.

NEX OL

Process energy dispersive X-ray fluorescence analyzer

Real-time, on-line process elemental analysis

NEX XT

Process gauge for high-level total sulfur measurement (0.02% to 6% S) of crude, bunker fuel, fuel oils, and other highly viscous hydrocarbons, including residuums.

SmartLab

Automated multipurpose X-ray diffractometer (XRD) with Guidance software. Powder diffraction, thin film metrology, SAXS, in-plane scattering, operando measurements.

SmartLab SE

Highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance.

Powder diffraction, thin film diffraction, SAXS, pole figure, residual stress and non-ambient experiments.