Menu

Winkel

NEX CGII

High-performance indirect excitation EDXRF for complex applications with trace elements and variable base matrices

Tungsten Filament SEM | SEM2100

Easy-to-use Scanning Electron Microscope Even for Novices

Tungsten Filament SEM | SEM3200

High-performance and Universal Tungsten Filament SEM Microscope

Tungsten Filament SEM | SEM3300

Next-generation Tungsten Filament Scanning Electron Microscope

NEX DE Series

60 kV EDXRF for high-performance results when analysis time or sample throughput is critical or when small spot analysis is required.

NEX QC+ QuantEZ

Benchtop Energy Dispersive X-ray Fluorescence (EDXRF) elemental analyzer. Non-destructively analyze from sodium (Na) through uranium (U) in almost any matrix, from solids and alloys to powders, liquids and slurries.

NEX QC Series

Combine performance and affordability for a wide range of analytical needs.

NEX LS

The Rigaku NEX LS represents the next evolution of scanning multi-element process coatings analyzers for web or coil applications.

NEX OL

Process energy dispersive X-ray fluorescence analyzer

Real-time, on-line process elemental analysis

NEX XT

Process gauge for high-level total sulfur measurement (0.02% to 6% S) of crude, bunker fuel, fuel oils, and other highly viscous hydrocarbons, including residuums.

SmartLab

Automated multipurpose X-ray diffractometer (XRD) with Guidance software. Powder diffraction, thin film metrology, SAXS, in-plane scattering, operando measurements.

SmartLab SE

Highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance.

Powder diffraction, thin film diffraction, SAXS, pole figure, residual stress and non-ambient experiments.

MiniFlex

Benchtop powder X-ray diffraction (XRD) instrument. Qualitative and quantitative phase analysis of poly-crystalline materials.

ZSX Primus IV

This tube-above sequential wavelength dispersive X-ray fluorescence (WDXRF) spectrometer delivers rapid quantitative determination of major and minor atomic elements, from beryllium (Be) through uranium (U), in a wide variety of sample types — with minimal standards.

ZSX Primus IVi

High-power, tube-below, sequential WDXRF spectrometer with new ZSX Guidance expert system software

ZSX Primus III Next

High power, tube above, sequential WDXRF spectrometer