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NEX CGII

High-performance, Cartesian-geometry EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin films

NEX DE

Benchtop Energy Dispersive X-ray Fluorescence (EDXRF) elemental analyzer. Non-destructively analyze from sodium (Na) through uranium (U) in almost any matrix, from solids and alloys to powders, liquids and slurries.

NEX DE VS

Variable spot size energy dispersive X-ray fluorescence (EDXRF) spectrometer

Elemental analysis of solids, liquids, powders, alloys and thin films.

NEX QC+ QuantEZ

Benchtop Energy Dispersive X-ray Fluorescence (EDXRF) elemental analyzer. Non-destructively analyze from sodium (Na) through uranium (U) in almost any matrix, from solids and alloys to powders, liquids and slurries.

NEX QC Series

Low-cost energy dispersive X-ray fluorescence (EDXRF) analyzer

Elemental analysis of solids, liquids, powders, alloys and thin films

NEX LS

The Rigaku NEX LS represents the next evolution of scanning multi-element process coatings analyzers for web or coil applications.

NEX OL

Process energy dispersive X-ray fluorescence analyzer

Real-time, on-line process elemental analysis

NEX XT

Process gauge for high-level total sulfur measurement (0.02% to 6% S) of crude, bunker fuel, fuel oils, and other highly viscous hydrocarbons, including residuums.

SmartLab

Automated multipurpose X-ray diffractometer (XRD) with Guidance software. Powder diffraction, thin film metrology, SAXS, in-plane scattering, operando measurements.

SmartLab SE

Highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance.

Powder diffraction, thin film diffraction, SAXS, pole figure, residual stress and non-ambient experiments.

MiniFlex

Benchtop powder X-ray diffraction (XRD) instrument. Qualitative and quantitative phase analysis of poly-crystalline materials.

ZSX Primus IV

This tube-above sequential wavelength dispersive X-ray fluorescence (WDXRF) spectrometer delivers rapid quantitative determination of major and minor atomic elements, from beryllium (Be) through uranium (U), in a wide variety of sample types — with minimal standards.

ZSX Primus IVi

High-power, tube-below, sequential WDXRF spectrometer with new ZSX Guidance expert system software

ZSX Primus III+

High power, tube above, sequential WDXRF spectrometer

SuperMini200

Benchtop sequential wavelength dispersive X-ray fluorescence (WDXRF) spectrometer for elemental analysis of oxygen (O) through uranium (U) of almost any material. High resolution and lower limits-of-detection.

UltraCarry

Disposable (single-use) sample retainer for X-ray fluorescence (XRF) analysis used to pre-concentrate an aqueous liquid sample onto a uniform sample carrier optimized for the suppression of background noise.