This tube-above sequential wavelength dispersive X-ray fluorescence (WDXRF) spectrometer delivers rapid quantitative determination of major and minor atomic elements, from beryllium (Be) through uranium (U), in a wide variety of sample types — with minimal standards.
Benchtop sequential wavelength dispersive X-ray fluorescence (WDXRF) spectrometer for elemental analysis of oxygen (O) through uranium (U) of almost any material.
High resolution and lower limits-of-detection.
Disposable (single-use) sample retainer for X-ray fluorescence (XRF) analysis used to pre-concentrate an aqueous liquid sample onto a uniform sample carrier optimized for the suppression of background noise.
X-ray scattering instrument designed for nano-structure analyses. NANOPIX can be used for both small angle scattering (SAXS) and wide angle scattering (WAXS) measurements