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A strong focus on Elemental analysis and Materials Science

Exclusive partner of leading
manufacturers

New in our range: Micromanipulation

Revolutionary micromanipulation system controlled by PC software with integrated microscope. Possible to manipulate samples by electric control while display monitoring.

 

Unlock the power of Simultaneous Thermal Analysis for sustainable coatings

Simultaneous Thermal Analysis is particularly well suited for corrosion and coating studies. By adjusting oxygen concentration and humidity, materials can be evaluated under simulated operating conditions.

 

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Elemental analysis

One of the simplest, non-destructive and most economic analytical methods for the determination of elemental composition of many types of materials.

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Xperts in elemental & structure analysis

Elemental Analysis

One of the simplest, non-destructive and most economic analytical methods for the determination of elemental composition of many types of materials.

Structure Analysis

A powerful tool that provides detailed information about the crystallographic structure, chemical composition, and physical properties of materials.

XRD

EPR and NMR

NMR is widely used to detect signals from atomic nuclei in a magnetic field, enabling the analysis of molecular structures. EPR detects unpaired electrons in a magnetic field and is used to study free radicals, transition-metal complexes, etc.

EPR

NMR

Scanning Electron Microscopy

Electron microscopy uses electron beams to achieve ultra-high resolution, revealing structures at the nanometer scale.

SEM

Exclusive partner of leading manufacturers

We are dedicated to provide you and assist you with application knowledge and technical support. Our expertise focuses on XRF (EDXRF, WDXRF), X-ray Diffraction (XRD), Thin Film analysis (XRF, XRD), X-ray imaging (X-ray CT), Structure analysis (SEM) and Sample preparation, including micromanipulation.

Brands we represent

Get inspired

From crystal structure to adsorption behaviour: two approaches to improve your current MOF & COF characterization workflow

YBMRS26 Conference

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